Nanometrics Incorporated - NANO

Nanometrics Incorporated provides process control metrology and inspection systems for use primarily in the fabrication of semiconductors and other solid-state devices worldwide. It offers automated metrology systems that provide optical critical dimension, thin film metrology, and wafer stress for transistor and interconnect metrology applications; and integrated metrology systems that are installed onto wafer processing equipment to provide near real-time measurements. The company’s materials characterization products include systems that are used to monitor the physical, optical, electrical, and material characteristics of discrete electronic industry, opto-electronic, high brightness LED, solar photovoltaic, compound semiconductor, strained silicon, and silicon-on-insulator devices, including composition, crystal structure, layer thickness, dopant concentration, contamination, and electron mobility. It also offers NanoDiffract, a modeling, visualization, and analysis software that takes signals from the automated and integrated metrology systems providing critical dimension, thickness, and optical properties from in line measurements; SpectraProbe, a model-less fitting engine that enables fast time to solution for in-line excursion detection and control; NanoGen, an enterprise scale computing hardware system that is deployed to run the computing intensive analysis software; and NanoCentral, a fab based networking and server system providing connectivity and compute support to SpectraProbe and connected measurement systems. The company was founded in 1975 and is headquartered in Milpitas, California.